Software APIs
Data Structures | Functions | Variables
dif_i2c_unittest::anonymous_namespace{dif_i2c_unittest.cc} Namespace Reference

Data Structures

class  I2cTest
 
class  ConfigTest
 
class  FifoCtrlTest
 
class  HostFifoConfigTest
 
class  TargetFifoConfigTest
 
class  ControlTest
 
class  OverrideTest
 
class  FifoTest
 
class  StretchTest
 
class  AddressTest
 

Functions

 TEST (ComputeTimingTest, StandardSpeed)
 
 TEST (ComputeTimingTest, FastSpeed)
 
 TEST (ComputeTimingTest, FastPlusSpeed)
 
 TEST (ComputeTimingTest, NullArgs)
 
 TEST_F (ConfigTest, NormalInit)
 
 TEST_F (ConfigTest, NullArgs)
 
 TEST_F (FifoCtrlTest, RxReset)
 
 TEST_F (FifoCtrlTest, RxNullArgs)
 
 TEST_F (FifoCtrlTest, FmtReset)
 
 TEST_F (FifoCtrlTest, FmtNullArgs)
 
 TEST_F (FifoCtrlTest, AcqReset)
 
 TEST_F (FifoCtrlTest, AcqNullArgs)
 
 TEST_F (FifoCtrlTest, TxReset)
 
 TEST_F (FifoCtrlTest, TxNullArgs)
 
 TEST_F (HostFifoConfigTest, SetLevels)
 
 TEST_F (HostFifoConfigTest, SetLevelsNullArgs)
 
 TEST_F (TargetFifoConfigTest, SetLevels)
 
 TEST_F (TargetFifoConfigTest, SetLevelsNullArgs)
 
 TEST_F (ControlTest, HostEnable)
 
 TEST_F (ControlTest, HostEnableNullArgs)
 
 TEST_F (ControlTest, ControllerHaltEvents)
 
 TEST_F (ControlTest, DeviceEnable)
 
 TEST_F (ControlTest, DeviceEnableNullArgs)
 
 TEST_F (ControlTest, DeviceHaltEvents)
 
 TEST_F (ControlTest, LLPBK)
 
 TEST_F (ControlTest, LLPBKNullArgs)
 
 TEST_F (ControlTest, AddrNack)
 
 TEST_F (ControlTest, AddrNackNullArgs)
 
 TEST_F (ControlTest, AckControl)
 
 TEST_F (ControlTest, AckControlNullArgs)
 
 TEST_F (OverrideTest, Enable)
 
 TEST_F (OverrideTest, EnableNullArgs)
 
 TEST_F (OverrideTest, Drive)
 
 TEST_F (OverrideTest, DriveNullArgs)
 
 TEST_F (OverrideTest, Sample)
 
 TEST_F (OverrideTest, SampleNullArgs)
 
 TEST_F (FifoTest, GetLevels)
 
 TEST_F (FifoTest, GetLevelsNullArgs)
 
 TEST_F (FifoTest, Read)
 
 TEST_F (FifoTest, ReadNullArgs)
 
 TEST_F (FifoTest, Acquire)
 
 TEST_F (FifoTest, AcqNullArgs)
 
 TEST_F (FifoTest, WriteRaw)
 
 TEST_F (FifoTest, WriteRawBadArgs)
 
 TEST_F (FifoTest, TransmitByte)
 
 TEST_F (FifoTest, TransmitBadArgs)
 
 TEST_F (StretchTest, ConfigTimeouts)
 
 TEST_F (StretchTest, ConfigTimeoutsBadArgs)
 
uint32_t assemble_address (dif_i2c_id_t *id0, dif_i2c_id_t *id1)
 
 TEST_F (AddressTest, SetDeviceAddress)
 
 TEST_F (AddressTest, SetAddressBadArgs)
 

Variables

constexpr dif_i2c_timing_config_t kBaseConfigSlow
 
constexpr dif_i2c_timing_config_t kBaseConfigFast
 

Variable Documentation

◆ kBaseConfigFast

constexpr dif_i2c_timing_config_t dif_i2c_unittest::anonymous_namespace{dif_i2c_unittest.cc}::kBaseConfigFast
constexpr
Initial value:
= {
.lowest_target_device_speed =
.clock_period_nanos = 20,
.sda_rise_nanos = 120,
.sda_fall_nanos = 130,
}

Definition at line 102 of file dif_i2c_unittest.cc.

◆ kBaseConfigSlow

constexpr dif_i2c_timing_config_t dif_i2c_unittest::anonymous_namespace{dif_i2c_unittest.cc}::kBaseConfigSlow
constexpr
Initial value:
= {
.lowest_target_device_speed =
.clock_period_nanos = 90,
.sda_rise_nanos = 250,
.sda_fall_nanos = 220,
}

Definition at line 94 of file dif_i2c_unittest.cc.