Testplan
Testpoints
Stage V1 Testpoints
smoke
Tests:
gpio_smoke
gpio_smoke_no_pullup_pulldown
gpio_smoke_en_cdc_prim
gpio_smoke_no_pullup_pulldown_en_cdc_prim
GPIO smoke test that exercises gpio pins as inputs or outputs, and performs data integrity checks by triggering scoreboard checks by reading data_in register. This test repeats following steps are random no. of times:
- Configures all gpio pins as inputs, drives random value on cio_gpio_i signal and reads data_in register after random delay
- Configures all gpio pins as outputs, programs direct_out and direct_oe registers to random values and reads data_in register after random delay The test is also run in a second build mode that enables the input synchronizers in order to cover the input paths through these primitives.
csr_hw_reset
Test: gpio_csr_hw_reset
Verify the reset values as indicated in the RAL specification.
- Write all CSRs with a random value.
- Apply reset to the DUT as well as the RAL model.
- Read each CSR and compare it against the reset value. it is mandatory to replicate this test for each reset that affects all or a subset of the CSRs.
- It is mandatory to run this test for all available interfaces the CSRs are accessible from.
- Shuffle the list of CSRs first to remove the effect of ordering.
csr_rw
Test: gpio_csr_rw
Verify accessibility of CSRs as indicated in the RAL specification.
- Loop through each CSR to write it with a random value.
- Read the CSR back and check for correctness while adhering to its access policies.
- It is mandatory to run this test for all available interfaces the CSRs are accessible from.
- Shuffle the list of CSRs first to remove the effect of ordering.
csr_bit_bash
Test: gpio_csr_bit_bash
Verify no aliasing within individual bits of a CSR.
- Walk a 1 through each CSR by flipping 1 bit at a time.
- Read the CSR back and check for correctness while adhering to its access policies.
- This verify that writing a specific bit within the CSR did not affect any of the other bits.
- It is mandatory to run this test for all available interfaces the CSRs are accessible from.
- Shuffle the list of CSRs first to remove the effect of ordering.
csr_aliasing
Test: gpio_csr_aliasing
Verify no aliasing within the CSR address space.
- Loop through each CSR to write it with a random value
- Shuffle and read ALL CSRs back.
- All CSRs except for the one that was written in this iteration should read back the previous value.
- The CSR that was written in this iteration is checked for correctness while adhering to its access policies.
- It is mandatory to run this test for all available interfaces the CSRs are accessible from.
- Shuffle the list of CSRs first to remove the effect of ordering.
csr_mem_rw_with_rand_reset
Test: gpio_csr_mem_rw_with_rand_reset
Verify random reset during CSR/memory access.
- Run csr_rw sequence to randomly access CSRs
- If memory exists, run mem_partial_access in parallel with csr_rw
- Randomly issue reset and then use hw_reset sequence to check all CSRs are reset to default value
- It is mandatory to run this test for all available interfaces the CSRs are accessible from.
regwen_csr_and_corresponding_lockable_csr
Tests:
gpio_csr_rw
gpio_csr_aliasing
Verify regwen CSR and its corresponding lockable CSRs.
- Randomly access all CSRs
- Test when regwen CSR is set, its corresponding lockable CSRs become read-only registers
Note:
- If regwen CSR is HW read-only, this feature can be fully tested by common CSR tests - csr_rw and csr_aliasing.
- If regwen CSR is HW updated, a separate test should be created to test it.
This is only applicable if the block contains regwen and locakable CSRs.
Stage V2 Testpoints
direct_and_masked_out
Tests:
gpio_random_dout_din
gpio_random_dout_din_no_pullup_pulldown
GPIO test that programs DIRECT_OUT
, DIRECT_OE
, MASKED_OUT_LOWER
,
MASKED_OE_LOWER
, MASKED_OUT_UPPER
and MASKED_OE_UPPER
registers and checks their
effect on GPIO pins as well as DATA_IN register value.
Every random iteration in this test would either:
- Program one or more of
\*OUT\*
and\*OE\*
registers, or - Drive new random value on GPIO pins
out_in_regs_read_write
Test: gpio_dout_din_regs_random_rw
GPIO test that exercises functionality of DATA_OUT and DATA_OE internal registers,
and DATA_IN
register by programming any of \*OUT\
and \*OE\*
registers,
respectively.
Every random iteration in this test would perform one out of following operations:
- Drive new random value on GPIO pins
- Write random value to any one of
\*OUT\*
,\*OE\*
orDATA_IN
registers - Read any one of
\*OUT\*
,\*OE\*
orDATA_IN
registers
gpio_interrupt_programming
Test: gpio_intr_rand_pgm
GPIO test which programs one or multiple interrupt registers to check GPIO interrupt
functionality
Every random iteration in this test would do either of following steps, and then read
INTR_STATE
register value:
- Drive new random value on GPIO pins (and thereby generate random interrupt event)
- Write random value to one or more interrupt registers that include
INTR_ENABLE
,INTR_CTRL_EN_FALLING
,INTR_CTRL_EN_LVL_LOW
,INTR_CTRL_EN_LVL_HIGH
andINTR_STATE
random_interrupt_trigger
Test: gpio_rand_intr_trigger
GPIO test that randomly generates and clears multiple GPIO interrupts for each
random programming of interrupt registers, and performs checks by reading DATA_IN
and INTR_STATE
registers.
Each random iteration of this test performs following operations:
- Programs one more interrupt registers to random values
- Following two operations are performed in parallel:
- Drive random value on GPIO pins multiple times, every time at a random time intervals (random number of clock cycles)
- Randomize random time interval (random number of clock cycles) and read either
DATA_IN
orINTR_STATE
register value at randomized time interval After every read, optionally perform random interrupt clearing operation by writing toINTR_STATE
register
interrupt_and_noise_filter
Test: gpio_intr_with_filter_rand_intr_event
GPIO test that exercise GPIO noise filter functionaliy along with random interrupt programming and randomly toggling each GPIO pin value, independently of other GPIO pins. Each random iteration performs following operations:
- programs random values in one or more interrupt registers
- optionally, programs new random value in
CTRL_EN_INPUT_FILTER
register - performs following operations in parallel:
- drives each GPIO pin independently such that each pin has stable value for random
number of clock cycles within the range
[1:FILTER_CYCLES]
, and also predicts updates in values ofDATA_IN
andINTR_STATE
registers - multiple registers reads, each for either
DATA_IN
orINTR_STATE
- drives each GPIO pin independently such that each pin has stable value for random
number of clock cycles within the range
noise_filter_stress
Test: gpio_filter_stress
GPIO test that stresses noise filter functionality by driving each GPIO pin such independently of other pins, and driving could be either synchronous to clock or asynchronous. Each iteration in test does following:
- Programs one or more interrupt registers with random values
- Programs noise filter register with random value
- Drives each GPIO pin with the mix of both synchronous and asynchronous driving, and each pin is driven independently of others
regs_long_reads_and_writes
Test: gpio_random_long_reg_writes_reg_reads
GPIO test that performs back-to-back register writes and back-to-back register reads on randomly selected GPIO registers. Each iteration in this test performs one out of following operations:
- Drive new random value on GPIO pins
- Perform multiple random writes on randomly selected GPIO registers
- Perform multiple random reads on randomly selected GPIO registers
full_random
Test: gpio_full_random
GPIO full random test that performs any of following in each iteration:
- Drive new random value on GPIO pins such that GPIO inputs and GPIO outputs shall not result in unknown value on any pin
- Write to one or more of
DIRECT_OUT
,DIRECT_OE
,MASKED_OUT_UPPER
,MASKED_OE_UPPER
,MASKED_OE_LOWER
andMASKED_OE_LOWER
registers such that GPIO inputs and GPIO outputs shall not result in unknown value on any pin - Write to one or more of GPIO interrupt registers that include
INTR_ENABLE
,INTR_CTRL_EN_FALLING
,INTR_CTRL_EN_RISING
,INTR_CTRL_EN_LVL_HIGH
,INTR_CTRL_EN_LVL_LOW
andINTR_STATE
- Write to other GPIO registers
DATA_IN
,INTR_TEST
,CTRL_EN_INPUT_FILTER
- Read any one of the GPIO registers
- Apply hard reset
stress_all
Test: gpio_stress_all
Stress_all test is a random mix of all the test above except csr tests, gpio full random, intr_test and other gpio test that disabled scoreboard
alert_test
Test: gpio_alert_test
Verify common alert_test
CSR that allows SW to mock-inject alert requests.
- Enable a random set of alert requests by writing random value to alert_test CSR.
- Check each
alert_tx.alert_p
pin to verify that only the requested alerts are triggered. - During alert_handshakes, write
alert_test
CSR again to verify that: Ifalert_test
writes to current ongoing alert handshake, thealert_test
request will be ignored. Ifalert_test
writes to current idle alert handshake, a new alert_handshake should be triggered. - Wait for the alert handshakes to finish and verify
alert_tx.alert_p
pins all sets back to 0. - Repeat the above steps a bunch of times.
intr_test
Test: gpio_intr_test
Verify common intr_test CSRs that allows SW to mock-inject interrupts.
- Enable a random set of interrupts by writing random value(s) to intr_enable CSR(s).
- Randomly “turn on” interrupts by writing random value(s) to intr_test CSR(s).
- Read all intr_state CSR(s) back to verify that it reflects the same value as what was written to the corresponding intr_test CSR.
- Check the cfg.intr_vif pins to verify that only the interrupts that were enabled and turned on are set.
- Clear a random set of interrupts by writing a randomly value to intr_state CSR(s).
- Repeat the above steps a bunch of times.
tl_d_oob_addr_access
Test: gpio_tl_errors
Access out of bounds address and verify correctness of response / behavior
tl_d_illegal_access
Test: gpio_tl_errors
Drive unsupported requests via TL interface and verify correctness of response / behavior. Below error cases are tested bases on the TLUL spec
- TL-UL protocol error cases
- invalid opcode
- some mask bits not set when opcode is
PutFullData
- mask does not match the transfer size, e.g.
a_address = 0x00
,a_size = 0
,a_mask = 'b0010
- mask and address misaligned, e.g.
a_address = 0x01
,a_mask = 'b0001
- address and size aren’t aligned, e.g.
a_address = 0x01
,a_size != 0
- size is greater than 2
- OpenTitan defined error cases
- access unmapped address, expect
d_error = 1
- write a CSR with unaligned address, e.g.
a_address[1:0] != 0
- write a CSR less than its width, e.g. when CSR is 2 bytes wide, only write 1 byte
- write a memory with
a_mask != '1
when it doesn’t support partial accesses - read a WO (write-only) memory
- write a RO (read-only) memory
- write with
instr_type = True
- access unmapped address, expect
tl_d_outstanding_access
Tests:
gpio_csr_hw_reset
gpio_csr_rw
gpio_csr_aliasing
gpio_same_csr_outstanding
Drive back-to-back requests without waiting for response to ensure there is one transaction outstanding within the TL device. Also, verify one outstanding when back- to-back accesses are made to the same address.
tl_d_partial_access
Tests:
gpio_csr_hw_reset
gpio_csr_rw
gpio_csr_aliasing
gpio_same_csr_outstanding
Access CSR with one or more bytes of data. For read, expect to return all word value of the CSR. For write, enabling bytes should cover all CSR valid fields.
Stage V2S Testpoints
tl_intg_err
Tests:
gpio_tl_intg_err
gpio_sec_cm
Verify that the data integrity check violation generates an alert.
- Randomly inject errors on the control, data, or the ECC bits during CSR accesses. Verify that triggers the correct fatal alert.
- Inject a fault at the onehot check in
u_reg.u_prim_reg_we_check
and verify the corresponding fatal alert occurs
sec_cm_bus_integrity
Test: gpio_tl_intg_err
Verify the countermeasure(s) BUS.INTEGRITY.
Stage V3 Testpoints
stress_all_with_rand_reset
Test: gpio_stress_all_with_rand_reset
This test runs 3 parallel threads - stress_all, tl_errors and random reset. After reset is asserted, the test will read and check all valid CSR registers.
Covergroups
regwen_val_when_new_value_written_cg
Cover each lockable reg field with these 2 cases:
- When regwen = 1, a different value is written to the lockable CSR field, and a read occurs after that.
- When regwen = 0, a different value is written to the lockable CSR field, and a read occurs after that.
This is only applicable if the block contains regwen and locakable CSRs.
tl_errors_cg
Cover the following error cases on TL-UL bus:
- TL-UL protocol error cases.
- OpenTitan defined error cases, refer to testpoint
tl_d_illegal_access
.
tl_intg_err_cg
Cover all kinds of integrity errors (command, data or both) and cover number of error bits on each integrity check.
Cover the kinds of integrity errors with byte enabled write on memory if applicable: Some memories store the integrity values. When there is a subword write, design re-calculate the integrity with full word data and update integrity in the memory. This coverage ensures that memory byte write has been issued and the related design logic has been verfied.